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Semi Conductor Test Equipment With Mixed Signal Devices

Semi Conductor Test Equipment With Mixed Signal Devices

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automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. 

Semiconductor ATE, named for testing semiconductor devices, can test a wide range of electronic devices and systems, from simple components (resistors, capacitors, and inductors) to integrated circuits (ICs), printed circuit boards (PCBs), and complex, completely assembled electronic systems. ATE systems are designed to reduce the amount of test time needed to verify that a particular device works or to quickly find its faults before the part has a chance to be used in a final consumer product. To reduce manufacturing costs and improve yield, semiconductor devices should be tested after being fabricated to prevent defective devices ending up with the consumer.

Topscom Technology is one of the leading manufacturers and suppliers who is committed to provide customers high quality and customized semi conductor test equipment with mixed signal devices. Our factory can also give you wholesale service which is made in China, welcome to get semi conductor test equipment with mixed signal devices with us.

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